Application of cover-free codes and combinatorial designs to two-stage testing

Discrete Applied Mathematics

Volumn 128, Issue 1 SPEC., 2003, Pages 11-26

  Berger, Toby ^a   Levenshtein, Vladimir I ^b  

^a Cornell University   (United States)

^b KELDYSH INSTITUTE OF APPLIED MATHEMATICS   (Russian Federation)

Author keywords

Block designs; Cover free codes; Steiner systems; Two stage testing

Indexed keywords

MONOCLONAL ANTIBODIES;

BLOCK DESIGNS; CDNA LIBRARIES; COMBINATORIAL DESIGN; COVER FREE CODES; GROUP TESTING; PROBABILISTIC PROPERTIES; STEINER SYSTEMS; TWO-STAGE;

CODES (SYMBOLS);

EID: 0038060503     PISSN: 0166218X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0166-218X(02)00433-X     Document Type: Conference Paper

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