In Situ Monitoring of Crystallization Processes Using Synchrotron X-ray Diffraction: The Search for Structural Precursors

Crystal Growth and Design

Volumn 2, Issue 4, 2002, Pages 269-272

  Davey, Roger J ^a   Liu, Wei ^a   Quayle, Michael J ^a   Tiddy, Gordon J T ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038058782     PISSN: 15287483     EISSN: None     Source Type: Journal    
DOI: 10.1021/cg025514j     Document Type: Article

References (23)

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