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Volumn 107, Issue 12, 2003, Pages 2637-2644

Computation and spectroelectrochemistry as complementary tools for the study of electrochemically induced charged defects in 4-[Bis(4-methylphenyl)amino]phenyl oligothiophenes as model systems for hole-transporting materials

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ELECTROCHEMISTRY; ELECTRONS; EXCITONS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HOLE TRAPS; MOLECULAR STRUCTURE; OXIDATION; POSITIVE IONS; PROBABILITY DENSITY FUNCTION;

EID: 0038055957     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp022484m     Document Type: Article
Times cited : (44)

References (45)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.