Mobility of NO+ in helium gas at 77 and 4.3 K

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 36, Issue 8, 2003, Pages 1515-1524

  Hidaka, H ^a   Jinno, S ^a   Tanuma, H ^a   Kobayashi, N ^a  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ELECTRIC FIELD EFFECTS; HELIUM; IONS; LOW TEMPERATURE EFFECTS; MASS SPECTROMETERS; MOLECULAR PHYSICS; NITROGEN OXIDES; POLARIZATION;

DRIFT TUBE MASS SPECTROMETER; NITROGEN OXIDE MOBILITY;

MASS SPECTROMETRY;

EID: 0038054555     PISSN: 09534075     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-4075/36/8/306     Document Type: Article

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