Scanning transmission x-ray microscopy at a bending magnet beamline at the Advanced Light Source

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 3-8

  Ade, H ^a   Kilcoyne, A L D ^a   Tyliszczak, T ^b,c   Hitchcock, P ^a,c   Anderson, E ^b   Harteneck, B ^b   Rightor, E G ^d   Mitchell, G E ^d   Hitchcock, A P ^c   Warwick, T ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c MCMASTER UNIVERSITY   (Canada)

^d DOW CHEMICAL COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT SOURCES; OPTICAL DESIGN; OPTICAL RESOLVING POWER; X RAY MICROSCOPES; X RAY OPTICS;

BENDING MAGNETS; BRIGHTNESS BENDING; ENERGY RESOLUTION; SCANNING TRANSMISSION X RAY MICROSCOPY;

MAGNETS;

EID: 0038054430     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:200300017     Document Type: Conference Paper

References (8)

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