Anisotropy of the dielectric permittivity of Sn2P2S6 measured with light-induced grating techniques

Applied Physics B: Lasers and Optics

Volumn 76, Issue 4, 2003, Pages 417-421

  Shumelyuk, A ^a   Barilov, D ^a   Odoulov, S ^a   Kratzig E ^b  

^a INSTITUTE OF HYDROBIOLOGY   (Ukraine)

^b UNIVERSITY OF OSNABRÜCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL GROWTH; CRYSTALS; DIFFRACTION GRATINGS; ELECTRIC SPACE CHARGE; FERROELECTRIC MATERIALS; HELIUM NEON LASERS; OPTICAL PROPERTIES; PERMITTIVITY; SPECTROSCOPY; TENSORS; TIN COMPOUNDS;

CHARGE MOBILITY; DIELECTRIC TENSOR; GAS TRANSPORT REACTION; PHOTOREFRACTIVE GRATING SPECTROSCOPY; TIN HYPOTHIODIPHOSPHATE;

PHOTOREFRACTIVE MATERIALS;

EID: 0038046172     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-003-1094-x     Document Type: Article

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