Measuring lateral magnetic structures in thin films using time-of-flight polarized neutron reflectometry

Physica B: Condensed Matter

Volumn 335, Issue 1-4, 2003, Pages 77-81

  Lee, W T ^a   Klose, F ^a   Yin, H Q ^b   Toperverg, B P ^c,d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF ALABAMA   (United States)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

^d PETERSBURG NUCLEAR PHYSICS INSTITUTE   (Russian Federation)

Author keywords

Distorted wave Born approximation; Lateral magnetic domains; Off specular scattering; Patterned magnetic arrays; Specular reflection; Time of flight neutron reflectometry

Indexed keywords

COBALT; LITHOGRAPHY; MAGNETIC DOMAINS; NEUTRON REFLECTION; NEUTRON SCATTERING;

BORN APPROXIMATION;

MAGNETIC THIN FILMS;

EID: 0038044597     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(03)00195-9     Document Type: Conference Paper

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