Optics development for the SPEAR mission

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4854, Issue , 2002, Pages 457-466

  Ryu, Kwangsun ^a   Nishikida, Kaori ^b   Edelstein, Jerry ^b   Seon, Kwangil ^c   Yuk, Insoo ^c   Min, Kyungwook ^a   Han, Wonyoung ^c   Korpela, Eric ^b   Chung, Ray ^b   McKee, Ken ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c KAO   (South Korea)

Author keywords

Far ultraviolet; Grating; Parabolic cylinder; Spectrometer

Indexed keywords

ABLATION; ASTROPHYSICS; DIFFRACTION GRATINGS; HOLOGRAPHY; ION BEAMS; LIGHT EMISSION; LIGHT REFLECTION; MIRRORS; PLASMAS; SPACE FLIGHT; ULTRAVIOLET SPECTROMETERS; ULTRAVIOLET SPECTROSCOPY;

ION BEAM ABLATION; PYREX PARABOLIC CYLINDERS; REFLECTIVE OPTICS; SPACE MISSION;

SPACE OPTICS;

EID: 0038025269     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.460015     Document Type: Conference Paper

References (5)

1. K. I. Seon, K. S. Ryu, I. S. Yuk, J. H. Park, U. W. Nam, W. Han, J. H. Seon, K. W. Min, J. Edelstein, and E. J. Korpela, "O vi emission line detection limit of far ultraviolet imaging spectrograph," J. Astro. Space Sci. 17, pp. 77-86, 2000.
2. J. M. Geary, "An overview of cylindrical optics tesing using a fiber optic reference," in Optical Manufacturing and Testing, V. J. Doherty and H. P. Stahl, eds., Proc. SPIE 2536, pp. 68-74, 1995.
3. S. M. Arnold, L. C. Maxey, J. E. Rogers, and R. C. Yoder, "Figure metrology of deep general aspherics using a conventional interferometer wiht cgh null," in Optical Manufacturing and Tesing, V. J. Doherty and H. P. Stahl, eds., Proc. SPIE 2536, pp. 106-116, 1995.
4. Diffraction International, 11345 Hwy. 7, #421, Minneapolis, Minnesota 55305.
5. K. S. Ryu, J. Edelstein, J. B. Song, Y. W. Lee, K. I. S. J. S. Chae, I. S. Yuk, E. J. Korpela, U. W. Nam, W. Han, and K. W. Min, "Testing method of off-axis parabolic cylinder mirror for fims," in Advanced Optical Manufacturing and Testing Technology 2000, Proc. SPIE 4231, pp. 312-319, 2000.