HRTEM, SEM and XRD characterization of nanocrystalline Sb2S3 thin films deposited by chemical bath route

Surface and Coatings Technology

Volumn 172, Issue 1, 2003, Pages 51-56

  Mane, R S ^a   Lokhande, C D ^b  

^a VISHWAKARMA INSTITUTE OF TECHNOLOGY   (India)

^b SHIVAJI UNIVERSITY   (India)

Author keywords

EDAX; HRTEM; Nanocrystalline materials; RBS; Thin films; XRD

Indexed keywords

COATING TECHNIQUES; ENERGY GAP; HIGH RESOLUTION ELECTRON MICROSCOPY; QUANTUM THEORY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CHEMICAL BATHS;

NANOSTRUCTURED MATERIALS;

FILM;

EID: 0038018146     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(03)00316-5     Document Type: Article

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