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Volumn , Issue , 2003, Pages 221-228
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Finite element analysis to develop a new accelerating test method for board level solder joints for high temperature electronics
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRONIC EQUIPMENT TESTING;
FAILURE ANALYSIS;
FATIGUE OF MATERIALS;
FINITE ELEMENT METHOD;
HIGH TEMPERATURE TESTING;
SOLDERED JOINTS;
STRAIN;
THERMAL CYCLING;
THERMAL LOAD;
THERMAL STRESS;
BENDING LOADS;
BOARD LEVEL SOLDER JOINTS;
FATIGUE FAILURES;
HIGH TEMPERATURE ELECTRONICS;
AUTOMOBILE ELECTRONIC EQUIPMENT;
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EID: 0038012873
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (10)
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