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Volumn , Issue , 2003, Pages 1095-1099

Design and stacking of an extremely thin chip-scale package

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; ENCAPSULATION; INTEGRATED CIRCUIT LAYOUT; SOLDERING ALLOYS; THREE DIMENSIONAL;

EID: 0038012414     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (18)

References (5)
  • 1
    • 0037738328 scopus 로고    scopus 로고
    • Advancements in stacked chip scale packaging provides system in a package functionality for wireless and handheld applications
    • Morihiro Kada and Lee Smith, "Advancements in Stacked Chip Scale Packaging Provides System in a Package Functionality for Wireless and Handheld Applications," Pan Pacific Microelectronics Symposium (2000)
    • (2000) Pan Pacific Microelectronics Symposium
    • Kada, M.1    Smith, L.2
  • 2
    • 0009617642 scopus 로고    scopus 로고
    • An extremely thin, BGA format chip scale package and stacking
    • Akito Yoshida, et al, "An Extremely Thin, BGA Format Chip Scale Package and Stacking," International Conference on Electronics Packaging (2001), pp. 44-47
    • (2001) International Conference on Electronics Packaging , pp. 44-47
    • Yoshida, A.1
  • 3
    • 0036287655 scopus 로고    scopus 로고
    • Three-dimensional very thin stacked packaging technology for SiP
    • Yuji Yano, et. al, "Three-dimensional Very Thin Stacked Packaging Technology for SiP," IEEE Electronic Components and Technology Conference (2002), pp. 1329-1334.
    • (2002) IEEE Electronic Components and Technology Conference , pp. 1329-1334
    • Yano, Y.1
  • 5
    • 0036294919 scopus 로고    scopus 로고
    • An extremely thin, BGA format chip-scale package and its board level reliability
    • Akito Yoshida, Kazuo Ishibashi, et al., "An Extremely Thin, BGA Format Chip-Scale Package and Its Board Level Reliability," Electronic Components and Technology Conference (2002), pp. 1335-1340.
    • (2002) Electronic Components and Technology Conference , pp. 1335-1340
    • Yoshida, A.1    Ishibashi, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.