Plasma oxidation and magnetoresistance in tunnel junction device

Thin Solid Films

Volumn 435, Issue 1-2, 2003, Pages 135-138

  Jeon, D M ^a   Park, J W ^a   Kim, Y S ^a   Yoon, D H ^a   Suh, S J ^a  

^a Sungkyunkwan University   (South Korea)

Author keywords

Al Ox; Magnetic tunnel junction; Plasma oxidation; Tunnel junction magnetoresistance

Indexed keywords

GLASS; MAGNETORESISTANCE; OXIDATION; PLASMA THEORY; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

PLASMA OXIDATION;

TUNNEL JUNCTIONS;

EID: 0038009097     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00404-8     Document Type: Conference Paper

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