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Volumn 19, Issue 9, 2003, Pages 3650-3655

Generation mechanism of shear yield stress for regular defect arrays in water-in-cholesteric liquid crystal emulsions

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; EMULSIONS; NEWTONIAN FLOW; SHEAR STRESS; YIELD STRESS;

EID: 0038004182     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la026923k     Document Type: Article
Times cited : (10)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.