Preparation of Al-Cu-Fe ultra-thin quasicrystalline films without protective coatings by MBE: Influence of processing

Materials Science and Engineering: A

Volumn 349, Issue 1-2, 2003, Pages 224-229

  Bonasso, N ^a   Pigeat, P ^a  

^a CNRS   (France)

Author keywords

PVD; Quasicrystal; Roughness; Thin film

Indexed keywords

ALUMINUM ALLOYS; ANNEALING; CRYSTALLINE MATERIALS; DEPOSITION; EVAPORATION; MOLECULAR BEAM EPITAXY; SURFACE ROUGHNESS; VACUUM;

QUASICRYSTALLINE FILMS;

ULTRATHIN FILMS;

FILM;

EID: 0037993976     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00770-0     Document Type: Article

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