Symmetry detection for automatic analog-layout recycling

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 1999-January, Issue , 1999, Pages 5-8

  Bourai, Youcef ^a   Shi, C J Richard ^a  

^a University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN;

ANALOG LAYOUT; LAYOUT COMPACTION; MASK LAYOUT; SYMMETRY CONSTRAINTS; SYMMETRY DETECTION;

RECYCLING;

EID: 0037992086     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.1999.759663     Document Type: Conference Paper

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