A study of energy transfer processes in zinc-porphyrin films using Monte Carlo simulation of fluorescence decay

Chemical Physics Letters

Volumn 345, Issue 1-2, 2001, Pages 141-150

  Yatskou, Mikalai M ^a   Donker, Harry ^a   Koehorst, Rob B M ^a   Van Hoek, Arie ^a   Schaafsma, Tjeerd J ^a  

^a WAGENINGEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037986788     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0009-2614(01)00867-3     Document Type: Article

References (29)

1. H. Donker, R.B.M. Koehorst, A. van Hoek, W. van Schaik, M.M. Yatskou, T.J. Schaafsma, J. Phys. Chem. B (in press).
2. Gregg B.A., Fox M.A., Bard A.J. J. Phys. Chem. 93:1989;4227.
3. Schaafsma T.J. Sol. Energy Mater. Sol. Cells. 38:1995;349.
4. Leray I., Verniéres M.C., Pansu R., Bied-Charreton C., Faure J. Thin Solid Films. 303:1997;295.
5. Kanayama N., Kanbara T., Kitano H. J. Phys. Chem. B. 104:2000;271.
6. Quillec M. Materials for Optoelectronics. 1996;Kluwer Academic Publishers, Boston.
7. Donati S. Photodetectors, Devices, Circuits and Applications. 2000;Plenum Press, New York.
8. Chopra K.L., Das S.R. Thin Film Solar Cells. 1983;Plenum Press, New York.
9. Yeow E.K.L., Giggino K.P., Reek J.H.N., Crossley M.J., Bosman A.W., Schenning A.P.H.J., Meijer E.W. J. Phys. Chem. B. 104:2000;2596.
10. Markovitsi D., Germain A., Millié P., Lécuyer P., Gallos L.K., Argyrakis P., Bengs H., Ringsdorf H. J. Phys. Chem. 99:1995;1005.
11. Kometani N., Nakajima H., Asami K., Yonezawa Y., Kajimoto O. J. Phys. Chem. B. 104:2000;9630.
12. Kanayama N., Kanbara T., Kitano H. J. Phys. Chem. B. 104:2000;271.
13. Sato N., Ito S., Sugiura K., Yamamoto M. J. Phys. Chem. A. 103:1999;3402.
14. Loura L.M.S., Prieto M. J. Chem. Phys. B. 104:2000;6911.
15. Kalman B., Johansson L.B.Å., Lindberg M., Engström S. J. Phys. Chem. 93:1989;8371.
16. M.M. Yatskou, H. Donker, E.G. Novikov, R.B.M. Koehorst, A. van Hoek, V.V. Apanasovich, T.J. Schaafsma, J. Phys. Chem. A (in press).
17. Andrews L., Demidov A. Resonance Energy Transfer. 1999;Wiley, New York.
18. Adler A.D., Longo F.R., Kampas F., Kim J. J. Inorg. Nucl. Chem. 32:1970;2443.
19. Adler A.D., Longo F.R., Shergalis W.J. Am. Chem. Soc. 86:1964;3145.
20. Visser A.J.W.G., van den Berg P.A.W., Visser N.V., van Hoek A., van den Burg H.A., Parsonage D., Claiborne A. J. Phys. Chem. B. 102:1998;10431.
21. van Hoek A., Visser A.J.W.G. Rev. Sci. Instrum. 52:1981;1199.
22. Shimizu Y., Miya M., Nagata A., Ohta K., Yamamoto I., Kusabayashi S. Liq. Cryst. 14:1993;795.
23. Shimizu Y., Higashiyama T., Fuchita T. Thin Solid Films. 331:1998;279.
24. Apanasovich V.V., Novikov E.G., Yatskov N.N. Proc. SPIE. 2980:1997;495.
25. Chowdhury F.N., Kolber Z.S., Barkley M.D. Rev. Sci. Instrum. 62:1991;47.
26. Bevington P.R. Data Reduction and Error Analysis for the Physical Sciences. 1969;McGraw-Hill, New York.
27. Maiti N.C., Mazumdar S., Periasamy N. J. Phys. Chem. 99:1995;10708.
28. López-Cornejo P., Costa S.M.B. Langmuir. 14:1998;2042.
29. Fonda H.N., Gilbert J.V., Cormier R.A., Sprague J.R., Kamioka K., Connoly J.S. J. Phys. Chem. 97:1993;7024.