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Volumn 72, Issue 9, 1998, Pages 1072-1074

A novel tool for mapping composition distributions in semiconductor microstructures - Application to InxGa1-xP quantum wires

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[No Author keywords available]

Indexed keywords


EID: 0037980753     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120968     Document Type: Review
Times cited : (6)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.