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Volumn 72, Issue 9, 1998, Pages 1072-1074
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A novel tool for mapping composition distributions in semiconductor microstructures - Application to InxGa1-xP quantum wires
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0037980753
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.120968 Document Type: Review |
Times cited : (6)
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References (10)
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