Co layer thickness dependence of exchange biasing for IrMn/Co and FeMn/Co

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6611-6613

  Seu, K A ^a   Huang, H ^a   Lesoine, J F ^b   Showman, H D ^a   Egelhoff Jr , W F ^c   Gan, L ^c   Reilly, A C ^a  

^a Dept of Economics and Thomas Jefferson Program in Public Policy at the College of William and Mary   (United States)

^b MORAVIAN COLLEGE   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FORCE; GROWTH (MATERIALS); IRIDIUM COMPOUNDS; IRON COMPOUNDS; KERR MAGNETOOPTICAL EFFECT; MAGNETRON SPUTTERING; SILICON; X RAY PHOTOELECTRON SPECTROSCOPY;

EXCHANGE BIAS FIELD;

FERROMAGNETIC MATERIALS;

EID: 0037977718     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1555332     Document Type: Conference Paper

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