Effect of grain boundaries on carrier lifetime in chemical-vapor-deposited diamond film

Applied Physics Letters

Volumn 77, Issue 10, 2000, Pages 1425-1427

  Yoneda, Hitoki ^a   Tokuyama, Kazutatsu ^a   Yamazaki, Riichi ^a   Ueda, Ken Ichi ^a   Yamamoto, Hironori ^b   Baba, Kazuhiro ^b  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^b NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037976405     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1308054     Document Type: Article

References (6)

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2. J. R. Morris, C. L. Fu, and K. M. Ho, Phys. Rev. B 54, 132 (1996).
3. H. Yoneda, K. Ueda, Y. Aikawa, K. Baba, and N. Shohata, Appl. Phys. Lett. 66, 460 (1995).
4. See, for example, S. A. Edmiston, G. Heiser, A. B. Sproul, and M. A. Green, J. Appl. Phys. 80, 6783 (1996).
5. See, for example, K. A. McIntosh, K. B. Nichols, S. Verghese, and E. R. Brown, Appl. Phys. Lett. 70, 354 (1997).
6. S. Iijima, Y. Aikawa, and K. Baba, Appl. Phys. Lett. 57, 2646 (1990).