Delamination of poylmer coatings from metal substrates: Submicroscopic and molecular aspects

Materials Research Society Symposium - Proceedings

Volumn 734, Issue , 2003, Pages 61-66

  Rohwerder, M ^a   Hornung, E ^a   Yu, Xing Wen ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION; DELAMINATION; OPTICAL RESOLVING POWER; SCANNING;

FILIFORM CORROSION;

ORGANIC COATINGS;

EID: 0037973673     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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