Investigation of dielectric breakdown probability distribution for vacuum disconnecting switch

Proceedings of the IEEE Power Engineering Society Transmission and Distribution Conference

Volumn 3, Issue ASIA PACIFIC, 2002, Pages 1780-1785

  Shioiri, Tetsu ^b   Sasage, Kosuke ^b   Kamikawaji, Toru ^b   Homma, Mitsutaka ^a   Kaneko, Eiji ^b  

^a TOSHIBA CORPORATION   (Japan)

^b NONE

Author keywords

Breakdown Probability distribution; No Load Switching; Vacuum Disconnecting Switch; Vacuum Insulation; Weibull plot

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC SWITCHES; VACUUM APPLICATIONS; WEIBULL DISTRIBUTION;

VACUUM DISCONNECTING SWITCHES;

ELECTRIC BREAKDOWN;

EID: 0037969433     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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