Application of the electro-mechanical impedance method for the identification of in-situ stress in structures

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4935, Issue , 2002, Pages 503-514

  Ong, C W ^a   Yang, Y ^a   Naidu, A S K ^a   Lu, Y ^a   Soh, C K ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Admittance; Algorithm; Beam; Electro mechanical; I dentification; Impedance; Monitoring; Piezoceramic; Simulation; Stress

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; ELASTIC MODULI; ELECTRIC ADMITTANCE; ELECTRIC IMPEDANCE; ELECTROMECHANICAL DEVICES; GENETIC ALGORITHMS; MONITORING; NONDESTRUCTIVE EXAMINATION; PIEZOELECTRIC TRANSDUCERS; STRESS ANALYSIS;

STRUCTURAL HEALTH MONITORING;

STRUCTURAL ANALYSIS;

EID: 0037964202     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.485621     Document Type: Conference Paper

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