Sketches with curvature: The curve indicator random field and Markov processes

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 25, Issue 4, 2003, Pages 387-400

  August, Jonas ^a   Zucker, Steven W ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b Yale University   (United States)

Author keywords

Contour enhancement; Curvature Brownian motion; Curve; Direction; Edge detection; Elastica; Euler spiral; Feynman Kac formula; Markov processes; Orientation; Posterior mean; Random fields; Sketch

Indexed keywords

EDGE DETECTION; MATHEMATICAL MODELS; MEASUREMENT ERRORS; PROBABILITY DISTRIBUTIONS;

CONTOUR ENHANCEMENT; CURVE INDICATOR RANDOM FIELD; EULER SPIRAL; FEYNMAN-KAC FORMULA;

MARKOV PROCESSES;

EID: 0037963256     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2003.1190567     Document Type: Article

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