Test results and analyses of conductor short samples for HT-7U

Cryogenics

Volumn 43, Issue 3-5, 2003, Pages 165-171

  Weng, P D ^a   Bruzzone, P ^b   Chen, Z M ^a   Stepanov, B ^b   Chen, J L ^a   Wang, F T ^a   Fang, J ^a   Yao, D M ^a   Xiao, B J ^a   Bi, Y F ^a   Li, B Z ^a  

^a INSTITUTE OF PLASMA PHYSICS   (China)

^b NONE

Author keywords

Cable in conduit conductor; Coupling loss; Current transfer; Pulse field; Stability margin

Indexed keywords

CRITICAL CURRENTS; ELECTRIC LOSSES; MAGNETS;

CABLE-IN-CONDUIT CONDUCTORS (CICC);

ELECTRIC CONDUITS;

EID: 0037961526     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0011-2275(03)00033-X     Document Type: Conference Paper

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