The electromechanical behavior of nichrome (80/20 wt.%) film

Thin Solid Films

Volumn 433, Issue 1-2 SPEC., 2003, Pages 337-343

  Kazi, Imam H ^a   Wild, P M ^a   Moore, T N ^a   Sayer, M ^a  

^a QUEEN S UNIVERSITY   (Canada)

Author keywords

Annealing; Gauge factor; Sheet resistance; Sputtering; Strain gauge; TCR; Thin film

Indexed keywords

ANNEALING; ELECTRIC RESISTANCE; SPUTTERING; STRAIN GAGES;

SHEET RESISTANCE;

THIN FILMS;

EID: 0037939767     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00390-0     Document Type: Conference Paper

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