Investigation of resonance light absorption and rectification by subnanostructures

Journal of Applied Physics

Volumn 80, Issue 1, 1996, Pages 565-568

  Lin, Guang H ^a   Abdu, Reyimjan ^a   Bockris, John O'M ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037933781     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362762     Document Type: Article

References (6)

1. A. M. Marks, US Patent No. 4445050 (1984).
2. J. C. Fletcher and R. L. Balley, US Patent No. 3760257 (1973).
3. Y. Yasuoko, The Tenth International Conference on Infrared and Millimeter Waves (IEEE, New York, 1985), p. 27.
4. L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
5. Diffraction pattern of the sample cell formed by He-Ne laser light consists of six spots, corresponding to m= ± 0.5, ± 1.5, and ± 2.5. However, this will not cause a single maximum output of short circuit current. The antenna length can be obtained by measuring the angle of these six spots. The calculated length is 1.05 μm.
6. G. H. Lin and J. O'M. Bockris, Final Report, U.S. Government Agency, 1994.