Sensitivity of the optical properties of porous silicon layers to the refractive index of liquid in the pores

Physica Status Solidi (A) Applied Research

Volumn 197, Issue 2, 2003, Pages 528-533

  Anderson, M A ^d   Tinsley Bown, A ^b   Allcock, P ^c   Perkins, E A ^b   Snow, P ^c   Hollings, M ^b   Smith, R G ^b   Reeves, C ^a   Squirrell, D J ^b   Nicklin, S ^b   Cox, T I ^a  

^a QINETIQ   (United Kingdom)

^b DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

^c University of Bath   (United Kingdom)

^d pSiMedica   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION (PROCESS); FOURIER TRANSFORMS; MIRRORS; REFLECTION; REFRACTIVE INDEX; SENSITIVITY ANALYSIS; SIGNAL TO NOISE RATIO; SOLUTIONS;

BRAGG MIRROR; MICROCAVITY; OPTICAL THICKNESS; PORES; POROUS SILICON LAYERS;

POROUS SILICON;

EID: 0037933371     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306558     Document Type: Conference Paper

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