Piezoresistance and electrical resistivity of Pd, Au, and Cu films

Thin Solid Films

Volumn 434, Issue 1-2, 2003, Pages 316-322

  Jen, S U ^a   Yu, C C ^a   Liu, C H ^a   Lee, G Y ^a  

^a INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

Piezoresistance; Resistivity; Surface roughness; Tunneling

Indexed keywords

ATOMIC FORCE MICROSCOPY; COALESCENCE; ELECTRIC CONDUCTIVITY; ELECTRON TUNNELING; SEPARATION; SURFACE ROUGHNESS;

PIEZORESISTANCE;

METALLIC FILMS;

EID: 0037905678     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00504-2     Document Type: Article

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