Spectroscopy of different sites in Pr3+-doped oxyfluoride glass ceramics

Microelectronics Journal

Volumn 34, Issue 5-8, 2003, Pages 549-551

  Wang, X J ^a   Zheng, H R ^b   Jia, D ^b   Huang, S H ^c   Meltzer, R S ^b   Dejneka, M J ^d   Yen, W M ^b  

^a GEORGIA SOUTHERN UNIVERSITY   (United States)

^b UNIVERSITY OF GEORGIA   (United States)

^c BEIJING JIAOTONG UNIVERSITY   (China)

^d Corning Inc ^*  (United States)

Author keywords

Oxyfluoride; Rare earth; Spectrum

Indexed keywords

ABSORPTION SPECTROSCOPY; DOPING (ADDITIVES); EMISSION SPECTROSCOPY; GLASS CERAMICS; MATRIX ALGEBRA; RARE EARTHS;

AMORPHOUS MATRICES;

PRASEODYMIUM;

EID: 0037905426     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(03)00045-4     Document Type: Conference Paper

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