Flexoelectric instability in nematic cells with weak anchoring energy

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 311, Issue 2-3, 2003, Pages 242-245

  Lelidis, I ^a,b   Barbero, G ^a  

^a POLITECNICO DI TORINO   (Italy)

^b Universite de Picardie Jules Verne   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS;

DOMAIN PATTERN; ELECTRIC FIELD INDUCED; EXTRAPOLATION LENGTH; FINITE THICKNESS; LOW THRESHOLD VOLTAGE; SLAB THICKNESS; STRUCTURAL INSTABILITY; WEAK ANCHORING;

THRESHOLD VOLTAGE;

ARTICLE; CHEMICAL STRUCTURE; ELECTRIC FIELD; ELECTRIC POTENTIAL; ENERGY; MATHEMATICAL ANALYSIS; MOLECULAR STABILITY; WAVEFORM;

EID: 0037905061     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0375-9601(03)00472-9     Document Type: Article

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