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Volumn 212-213, Issue SPEC., 2003, Pages 595-600
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Morphology changes of Si(0 0 1) surfaces during wet chemical halogenation
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Author keywords
Atomic force microscopy; Etching; Organic films; Silicon; Surface morphology
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Indexed keywords
AROMATIC COMPOUNDS;
ATOMIC FORCE MICROSCOPY;
ETCHING;
GRAFTING (CHEMICAL);
HALOGENATION;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
SELF ASSEMBLY;
SURFACE ROUGHNESS;
ORGANIC FILMS;
SILICON;
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EID: 0037903248
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(03)00133-8 Document Type: Conference Paper |
Times cited : (4)
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References (8)
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