Thermal-stress effects on the temperature sensitivity of optical waveguides

Journal of the Optical Society of America B: Optical Physics

Volumn 20, Issue 6, 2003, Pages 1326-1333

  Huang, M ^a   Yan, X ^b  

^a Princeton University   (United States)

^b TelASIC Communications   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; OPTOELECTRONIC DEVICES; REFRACTIVE INDEX; THERMAL STRESS;

TEMPERATURE SENSITIVITY;

OPTICAL WAVEGUIDES;

EID: 0037901716     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.20.001326     Document Type: Article

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