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Volumn 38, Issue 5, 2003, Pages 865-874

New palladium phosphate complexes: K2PdP2O7 and K3.5Pd2.25(P2O7)2 synthesis, single crystal structure and conductivity

Author keywords

A. Ceramics; C. X ray diffraction; D. Crystal structure; D. Electrical properties

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; PALLADIUM COMPOUNDS; POSITIVE IONS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION;

EID: 0037882111     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(03)00021-7     Document Type: Article
Times cited : (21)

References (16)
  • 5
    • 0003409324 scopus 로고
    • Siemens Analytical X-ray Instruments, Inc., Madison, WI, USA
    • XSCANS Users Manual, Siemens Analytical X-ray Instruments, Inc., Madison, WI, USA, 1991.
    • (1991) XSCANS Users Manual
  • 8
    • 0037833023 scopus 로고    scopus 로고
    • Siemens, XEMP, Siemens Analytical X-ray Instruments, Inc., Madison, WI, USA, 1991.
    • Siemens, XEMP, Siemens Analytical X-ray Instruments, Inc., Madison, WI, USA, 1991.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.