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Volumn 87, Issue 11, 2000, Pages 8159-8164
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X-ray diffraction and phenomenological studies of the engineered monoclinic crystal domains in single crystal relaxor ferroelectrics
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0037873412
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.373512 Document Type: Article |
Times cited : (88)
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References (16)
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