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Volumn 87, Issue 11, 2000, Pages 8159-8164

X-ray diffraction and phenomenological studies of the engineered monoclinic crystal domains in single crystal relaxor ferroelectrics

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EID: 0037873412     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373512     Document Type: Article
Times cited : (88)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.