|
Volumn 2793, Issue , 1996, Pages 78-95
|
Photomask blanks enhancement by optimizing resist baking and coating for advanced e-beam reticle fabrication
a a a a a |
Author keywords
Coating thickness; Electron beam resist; Linearity; Pattern edge roughness; Photomask blanks; Process latitude; Reticle; Soft baking; Thin resist
|
Indexed keywords
FABRICATION;
MASKS;
OPTICAL INSTRUMENTS;
PHOTOLITHOGRAPHY;
PHOTOMASKS;
POLYMERS;
THICKNESS MEASUREMENT;
X RAYS;
COATING THICKNESS;
ELECTRON BEAM RESIST;
LINEARITY;
PATTERN EDGE ROUGHNESS;
PHOTOMASK BLANKS;
PROCESS LATITUDES;
RETICLE;
SOFT-BAKING;
THIN RESIST;
PLASTIC COATINGS;
|
EID: 0037871440
PISSN: 0277786X
EISSN: 1996756X
Source Type: Conference Proceeding
DOI: 10.1117/12.245209 Document Type: Conference Paper |
Times cited : (5)
|
References (15)
|