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Volumn 2793, Issue , 1996, Pages 78-95

Photomask blanks enhancement by optimizing resist baking and coating for advanced e-beam reticle fabrication

Author keywords

Coating thickness; Electron beam resist; Linearity; Pattern edge roughness; Photomask blanks; Process latitude; Reticle; Soft baking; Thin resist

Indexed keywords

FABRICATION; MASKS; OPTICAL INSTRUMENTS; PHOTOLITHOGRAPHY; PHOTOMASKS; POLYMERS; THICKNESS MEASUREMENT; X RAYS;

EID: 0037871440     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.245209     Document Type: Conference Paper
Times cited : (5)

References (15)
  • 1
    • 85079283599 scopus 로고    scopus 로고
    • Overview of current and future reticle processing systems and system improvements that will enable the reticle manufacturer to meet future needs., Vol. CR51
    • Overview of current and future reticle processing systems and system improvements that will enable the reticle manufacturer to meet future needs. Kathy S. Miner, SPIE Vol. CR51.
    • Spie
    • Miner, K.S.1
  • 2
    • 85079273846 scopus 로고    scopus 로고
    • Further work in optimizing PBS : Is it capable ofmeeting specifications for 256 Mbit DRAM reticle manufacturing?, Charles Sauer, SPIE
    • Further work in optimizing PBS : Is it capable ofmeeting specifications for 256 Mbit DRAM reticle manufacturing? Robert Dean, Charles Sauer, SPIE Vol. 2621.
    • , vol.2621
    • Robert, D.1
  • 3
    • 85079271453 scopus 로고    scopus 로고
    • Evaluation ofthin PBS resist film for improved feature linearity., et.al. SPIE
    • Evaluation ofthin PBS resist film for improved feature linearity. Larry Davis, et.al., SPIE Vol. 2612.
    • Larry Davis , vol.2612
  • 4
    • 85079279148 scopus 로고    scopus 로고
    • Novel technique on photomask blanks enhancement for the laser reticle writer, et.al, SPIE
    • Novel technique on photomask blanks enhancement for the laser reticle writer, Hideo Kobayashi, et.al, SPIE Vol. 2621.
    • Hideo Kobayashi , vol.2621
  • 5
    • 85079281129 scopus 로고    scopus 로고
    • PBS; Poly(butene-1-sulfone) is a product and trademark of CHISSO Corporation
    • PBS; Poly(butene-1-sulfone) is a product and trademark of CHISSO Corporation.
  • 6
    • 85079285771 scopus 로고    scopus 로고
    • EBR-9, EBR-9 HS31 and EBR-900 M-1 are products and trademarks of Toray Industries, Inc
    • EBR-9, EBR-9 HS31 and EBR-900 M-1 are products and trademarks of Toray Industries, Inc.
  • 7
    • 85079279095 scopus 로고    scopus 로고
    • ZEP81O and ZEP7000 are products and trademarks of Nippon Zeon Co. LTD
    • ZEP81O and ZEP7000 are products and trademarks of Nippon Zeon Co., LTD.
  • 8
    • 85079275288 scopus 로고    scopus 로고
    • TM-005 is a product and trademark of Canon sales Co
    • TM-005 is a product and trademark of Canon sales Co.
  • 9
    • 85079287710 scopus 로고    scopus 로고
    • HLS-8000 is a product and trademark of TOSOH
    • HLS-8000 is a product and trademark of TOSOH.
  • 10
    • 85079275706 scopus 로고    scopus 로고
    • ELS-3700 is a product and trademark of ELIONIX INC
    • ELS-3700 is a product and trademark of ELIONIX INC.
  • 11
    • 85079267272 scopus 로고    scopus 로고
    • KLA-2l9 is a product and trademark of KLA Instruments Corporation
    • KLA-2l9 is a product and trademark of KLA Instruments Corporation.
  • 12
    • 85079288563 scopus 로고    scopus 로고
    • MAP-2B is a product and trademark of Nikon
    • MAP-2B is a product and trademark of Nikon.
  • 13
    • 85079273748 scopus 로고    scopus 로고
    • EQZ50O92CAR3∗ and EHQZ5O092CAR3∗ are products and trademarks of HOYA Corporation
    • EQZ50O92CAR3∗ and EHQZ5O092CAR3∗ are products and trademarks of HOYA Corporation.
  • 14
    • 85079266634 scopus 로고    scopus 로고
    • MEBES is a trademark of Etec Systems, Inc
    • MEBES is a trademark of Etec Systems, Inc.
  • 15
    • 85079291157 scopus 로고    scopus 로고
    • JBX is a trademark of JEOL, Inc
    • JBX is a trademark of JEOL, Inc.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.