Performance degradation of a Michelson interferometer due to random sampling errors

Applied Optics

Volumn 38, Issue 1, 1999, Pages 139-151

  Cohen, Douglas L ^a  

^a ITT Aerospace   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037862898     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.000139     Document Type: Article

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