Determination of the Anomalous Scattering Factors in the Soft-X-ray Range using Diffraction from a Multilayer

Journal of Applied Crystallography

Volumn 31, Issue 5, 1998, Pages 700-707

  Seve L ^a   Tonnerre, J M ^a   Raoux, D ^a  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037860885     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898003227     Document Type: Article

References (25)

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