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Volumn 374, Issue , 2002, Pages 167-172
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Development of sub-half micrometric structures with high aspect ratio using a multi-layer lithography e-beam process and plasma dry etching
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Author keywords
e beam lithography; High aspect ratio structures; Nanolithography; Nanostructure; Novolac; Plasma etching
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Indexed keywords
ASPECT RATIO;
ELECTRON BEAM LITHOGRAPHY;
NANOTECHNOLOGY;
PHOTORESISTS;
PLASMA ETCHING;
SCANNING ELECTRON MICROSCOPY;
HIGH ASPECT RATIO STRUCTURES;
MICROMACHINES;
MICROMETRIC STRUCTURES;
NOVOLAC;
NANOSTRUCTURED MATERIALS;
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EID: 0037858258
PISSN: 1058725X
EISSN: None
Source Type: Journal
DOI: 10.1080/10587250210491 Document Type: Article |
Times cited : (3)
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References (3)
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