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Volumn 374, Issue , 2002, Pages 167-172

Development of sub-half micrometric structures with high aspect ratio using a multi-layer lithography e-beam process and plasma dry etching

Author keywords

e beam lithography; High aspect ratio structures; Nanolithography; Nanostructure; Novolac; Plasma etching

Indexed keywords

ASPECT RATIO; ELECTRON BEAM LITHOGRAPHY; NANOTECHNOLOGY; PHOTORESISTS; PLASMA ETCHING; SCANNING ELECTRON MICROSCOPY;

EID: 0037858258     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250210491     Document Type: Article
Times cited : (3)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.