Raman-scattering study of isotopically engineered crystalline

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 2, 1996, Pages 920-929

  Horoyski, P ^a   Thewalt, M ^a   Anthony, T ^b  

^a SIMON FRASER UNIVERSITY   (Canada)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037857602     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.920     Document Type: Article

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