A tandem transmission/reflection mode XRD instrument including XRF for in-situ measurement of martian rocks and soils

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4859, Issue , 2002, Pages 87-92

  Delhez, R ^a   Van Der Gaast, S J ^b   Wielders, A A ^c   De Boer, J L ^d   Helmholdt, R B ^e   Van Mechelen, J B ^e   Reiss, C A ^f   Woning, L ^g   Schenk, H ^f  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b ROYAL NETHERLANDS INSTITUTE FOR SEA RESEARCH   (Netherlands)

^c TNO   (Netherlands)

^d UNIVERSITY OF GRONINGEN   (Netherlands)

^e UNIVERSITY OF AMSTERDAM   (Netherlands)

^f MALVERN INSTRUMENTS LTD   (United Kingdom)

^g Bruker Nonius BV   (Netherlands)

Author keywords

Mars; Minerology; X ray diffraction

Indexed keywords

ATOMS; CLAY MINERALS; DIFFRACTOMETERS; ELECTRONS; EXPERIMENTAL MINERALOGY; FLUORESCENCE; LIGHT REFLECTION; LIGHT TRANSMISSION; MOLECULAR DYNAMICS; X RAY DIFFRACTION ANALYSIS;

MARTIAN ROCK; MARTIAN SOIL; REFLECTION MODE DIFFRACTOMETER; X-RAY FLOURESCENCE;

MARTIAN SURFACE ANALYSIS;

EID: 0037853376     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.457340     Document Type: Conference Paper

References (2)

1. Sarrazin P., Blake D., Bish D., Vaniman D., and Collins S., A miniature XRD/XRF instrument for in-situ characterization of Martian soils and rocks, J. Phys. IV France 8, (1998) 465-470.
2. Vaniman D., Bish D., Blake D., Elliot S.T., Sarazin P., Collins S.A., and Chipera S., Landed XRD/XRF analysis of prime targets in the search for past and present Martian life, J. Geophys. Res., Vol. 103, No. E13 (1998) 31,477-31,489.