Cost of yield

IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings

Volumn , Issue , 2003, Pages 165-170

  Maynard, Daniel N ^a   Kerr, David S ^a   Whiteside, Cynthia ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

Characterization; Cost accounting; IBM; Scrap management; Yield

Indexed keywords

CALCULATIONS; COST EFFECTIVENESS; DECISION MAKING; ECONOMIC AND SOCIAL EFFECTS; INDUSTRIAL ECONOMICS; INDUSTRIAL MANAGEMENT; PRODUCT DEVELOPMENT; PRODUCTIVITY; RESOURCE ALLOCATION;

COST OF YIELD; DESIGN FOR MANUFACTURE INITIATIVES; MANUFACTURING ENGINEERING; YIELD LIMITING DECISIONS;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0037843282     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. Shane Moriarity and Carl P. Allen, "Cost Accounting," Harper & Row, 1984.
2. Burlington Cost Account Manual, Various Desk Procedure Documents.