-
4
-
-
0343215213
-
-
Hellgren N., Johansson M.P., Broitman E., Hultman L., Sundgren J.E. Phys. Rev. Part B. 59:1999;5162.
-
(1999)
Phys. Rev. Part B
, vol.59
, pp. 5162
-
-
Hellgren, N.1
Johansson, M.P.2
Broitman, E.3
Hultman, L.4
Sundgren, J.E.5
-
10
-
-
0038228087
-
-
Alexandrou I., Baxendale M., Rupesinghe N.L., Amaratunga G.A.J., Kiely C.J. J. Vac. Sci. Technol. Part B. 18:2000;2968.
-
(2000)
J. Vac. Sci. Technol. Part B
, vol.18
, pp. 2968
-
-
Alexandrou, I.1
Baxendale, M.2
Rupesinghe, N.L.3
Amaratunga, G.A.J.4
Kiely, C.J.5
-
11
-
-
26444594415
-
-
Liu X.W., Tsai S.H., Lee L.H., Yang M.X., Yang A.C.M., Lin I.N., Shih H.C. J. Vac. Sci. Technol. Part B. 18:2000;1840.
-
(2000)
J. Vac. Sci. Technol. Part B
, vol.18
, pp. 1840
-
-
Liu, X.W.1
Tsai, S.H.2
Lee, L.H.3
Yang, M.X.4
Yang, A.C.M.5
Lin, I.N.6
Shih, H.C.7
-
13
-
-
0034205906
-
-
Aono M., Nitta S., Katsuno T., Itoh T., Nonomura S. Appl. Surf. Sci. 159-160:2000;341.
-
(2000)
Appl. Surf. Sci.
, vol.159-160
, pp. 341
-
-
Aono, M.1
Nitta, S.2
Katsuno, T.3
Itoh, T.4
Nonomura, S.5
-
14
-
-
12044253618
-
-
Marton D., Boyd K.J., Al-Bayati A.H., Todorov S.S., Rabalais J.W. Phys. Rev. Lett. 73:1994;118.
-
(1994)
Phys. Rev. Lett.
, vol.73
, pp. 118
-
-
Marton, D.1
Boyd, K.J.2
Al-Bayati, A.H.3
Todorov, S.S.4
Rabalais, J.W.5
-
18
-
-
0010029489
-
-
Tabbal M., Mérel P., Moisa S., Chaker M., Ricard A., Moisan M. Appl. Phys. Lett. 69:1996;1698.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 1698
-
-
Tabbal, M.1
Mérel, P.2
Moisa, S.3
Chaker, M.4
Ricard, A.5
Moisan, M.6
-
24
-
-
0033369139
-
-
Jama C., Dessaux O., Goudmand P., Soro J.M., Rats D., von Stebut J. Surf. Coat. Technol. 116-119:1999;59.
-
(1999)
Surf. Coat. Technol.
, vol.116-119
, pp. 59
-
-
Jama, C.1
Dessaux, O.2
Goudmand, P.3
Soro, J.M.4
Rats, D.5
Von Stebut, J.6
-
27
-
-
0029485366
-
-
Pels J.R., Kapteijn F., Moulijn J.A., Zhu Q., Thomas K.M. Carbon. 33:1995;1641.
-
(1995)
Carbon
, vol.33
, pp. 1641
-
-
Pels, J.R.1
Kapteijn, F.2
Moulijn, J.A.3
Zhu, Q.4
Thomas, K.M.5
-
28
-
-
0032288837
-
-
Spaeth C., Kühn M., Richter F., Falke U., Hietschold M., Kilper R., Kreissig U. Diam. Relat. Mater. 7:1998;1727.
-
(1998)
Diam. Relat. Mater.
, vol.7
, pp. 1727
-
-
Spaeth, C.1
Kühn, M.2
Richter, F.3
Falke, U.4
Hietschold, M.5
Kilper, R.6
Kreissig, U.7
-
29
-
-
0001060792
-
-
Ripalda J.M., Roman E., Diaz N., Galan L., Montero I., Comelli G., Baraldi A., Lizzit S., Goldoni A., Paolucci G. Phys. Rev. Part B. 60:1999;R3705.
-
(1999)
Phys. Rev. Part B
, vol.60
-
-
Ripalda, J.M.1
Roman, E.2
Diaz, N.3
Galan, L.4
Montero, I.5
Comelli, G.6
Baraldi, A.7
Lizzit, S.8
Goldoni, A.9
Paolucci, G.10
-
31
-
-
0000030801
-
-
Le Normand F., Hommet J., Szorenyi T., Fuchs C., Fogarassy E. Phys. Rev. Part B. 64:2001;235416.
-
(2001)
Phys. Rev. Part B
, vol.64
, pp. 235416
-
-
Le Normand, F.1
Hommet, J.2
Szorenyi, T.3
Fuchs, C.4
Fogarassy, E.5
-
32
-
-
0000425478
-
-
Ronning C., Feldermann H., Merk R., Hofsåss H., Reinke P., Thiele J.U. Phys. Rev. Part B. 58:1998;2207.
-
(1998)
Phys. Rev. Part B
, vol.58
, pp. 2207
-
-
Ronning, C.1
Feldermann, H.2
Merk, R.3
Hofsåss, H.4
Reinke, P.5
Thiele, J.U.6
-
33
-
-
0035875652
-
-
Hayashi Y., Yu G., Rahman M.M., Krishna K.M., Soga T., Jimbo T., Umeno M. J. Appl. Phys. 89:2001;7924.
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 7924
-
-
Hayashi, Y.1
Yu, G.2
Rahman, M.M.3
Krishna, K.M.4
Soga, T.5
Jimbo, T.6
Umeno, M.7
-
34
-
-
0028732662
-
-
Rossi F., Andre B., van Veen A., Mijnarends P.E., Schut H., Labohm F., Delplancke M.P., Dunlop M., Anger E. Thin Solid Films. 253:1994;85.
-
(1994)
Thin Solid Films
, vol.253
, pp. 85
-
-
Rossi, F.1
Andre, B.2
Van Veen, A.3
Mijnarends, P.E.4
Schut, H.5
Labohm, F.6
Delplancke, M.P.7
Dunlop, M.8
Anger, E.9
-
35
-
-
0030219231
-
-
Kobayashi S., Nozaki S., Morisaki H., Fukui S., Masaki S. Thin Solid Films. 281-282:1996;289.
-
(1996)
Thin Solid Films
, vol.281-282
, pp. 289
-
-
Kobayashi, S.1
Nozaki, S.2
Morisaki, H.3
Fukui, S.4
Masaki, S.5
-
36
-
-
0000613326
-
-
Xin H., Lin C., Xu W., Wang L., Zou S., Wu X., Shi X., Zhu H. J. Appl. Phys. 79:1996;2364.
-
(1996)
J. Appl. Phys.
, vol.79
, pp. 2364
-
-
Xin, H.1
Lin, C.2
Xu, W.3
Wang, L.4
Zou, S.5
Wu, X.6
Shi, X.7
Zhu, H.8
-
37
-
-
0032678230
-
-
Gu Y.S., Zhang Y.P., Duan Z.J., Chang X.R., Tian Z.Z., Chen N.X., Dong C., Shi D.X., Zhang X.F., Yuan L. J. Mater. Sci. 34:1999;3117.
-
(1999)
J. Mater. Sci.
, vol.34
, pp. 3117
-
-
Gu, Y.S.1
Zhang, Y.P.2
Duan, Z.J.3
Chang, X.R.4
Tian, Z.Z.5
Chen, N.X.6
Dong, C.7
Shi, D.X.8
Zhang, X.F.9
Yuan, L.10
-
38
-
-
0000140081
-
-
Chen L.C., Yang C.Y., Bhusari D.M., Chen K.H., Lin M.C., Lin J.C., Chuang T.J. Diam. Relat. Mater. 5:1996;514.
-
(1996)
Diam. Relat. Mater.
, vol.5
, pp. 514
-
-
Chen, L.C.1
Yang, C.Y.2
Bhusari, D.M.3
Chen, K.H.4
Lin, M.C.5
Lin, J.C.6
Chuang, T.J.7
-
41
-
-
0004133516
-
-
Gaussian, Inc., Pittsburgh, PA
-
M.J. Frisch, G.W. Trucks, H.B. Schlegel, G.E. Scuseria, M.A. Robb, J.R. Cheeseman, V.G. Zakrzewski, J.A. Montgomery, Jr., R.E. Stratmann, J.C. Burant, S. Dapprich, J.M. Millam, A.D. Daniels, K.N. Kudin, M.C. Strain, O. Farkas, J. Tomasi, V. Barone, M. Cossi, R. Cammi, B. Mennucci, C. Pomelli, C. Adamo, S. Clifford, J. Ochterski, G.A. Petersson, P.Y. Ayala, Q. Cui, K. Morokuma, D.K. Malick, A.D. Rabuck, K. Raghavachari, J.B. Foresman, J. Cioslowski, J.V. Ortiz, A.G. Baboul, B.B. Stefanov, G. Liu, A. Liashenko, P. Piskorz, I. Komaromi, R. Gomperts, R.L. Martin, D.J. Fox, T. Keith, M.A. Al- Laham, C.Y. Peng, A. Nanayakkara, C. Gonzalez, M. Challacombe, P.M.W. Gill, B. Johnson, W. Chen, M.W. Wong, J.L. Andres, C. Gonzalez, M. Head-Gordon, E.S. Replogle and J.A. Pople, Gaussian 98 (Revision A.7), Gaussian, Inc., Pittsburgh, PA, (1998).
-
(1998)
Gaussian 98 (Revision A.7)
-
-
Frisch, M.J.1
Trucks, G.W.2
Schlegel, H.B.3
Scuseria, G.E.4
Robb, M.A.5
Cheeseman, J.R.6
Zakrzewski, V.G.7
Montgomery J.A., Jr.8
Stratmann, R.E.9
Burant, J.C.10
Dapprich, S.11
Millam, J.M.12
Daniels, A.D.13
Kudin, K.N.14
Strain, M.C.15
Farkas, O.16
Tomasi, J.17
Barone, V.18
Cossi, M.19
Cammi, R.20
Mennucci, B.21
Pomelli, C.22
Adamo, C.23
Clifford, S.24
Ochterski, J.25
Petersson, G.A.26
Ayala, P.Y.27
Cui, Q.28
Morokuma, K.29
Malick, D.K.30
Rabuck, A.D.31
Raghavachari, K.32
Foresman, J.B.33
Cioslowski, J.34
Ortiz, J.V.35
Baboul, A.G.36
Stefanov, B.B.37
Liu, G.38
Liashenko, A.39
Piskorz, P.40
Komaromi, I.41
Gomperts, R.42
Martin, R.L.43
Fox, D.J.44
Keith, T.45
Al-Laham, M.A.46
Peng, C.Y.47
Nanayakkara, A.48
Gonzalez, C.49
Challacombe, M.50
Gill, P.M.W.51
Johnson, B.52
Chen, W.53
Wong, M.W.54
Andres, J.L.55
Gonzalez, C.56
Head-Gordon, M.57
Replogle, E.S.58
Pople, J.A.59
more..
-
43
-
-
0038566844
-
-
C.D. Wagner, A.V. Naumkin, A.K. Vass, J.W. Allison, C.J. Powell, J.R. Rumble Jr., NIST X-ray Photoelectron Spectroscopy Database NIST Standard Reference Database 20, Version 3.2 (Web Version).
-
NIST X-ray Photoelectron Spectroscopy Database NIST Standard Reference Database 20, Version 3.2 (Web Version)
-
-
Wagner, C.D.1
Naumkin, A.V.2
Vass, A.K.3
Allison, J.W.4
Powell, C.J.5
Rumble J.R., Jr.6
-
45
-
-
0037552717
-
-
Casnovas J., Ricart J.M., Rubio J., Illas F., Matros J.M.J. J. Am. Chem. Soc. 118:1996;118.
-
(1996)
J. Am. Chem. Soc.
, vol.118
, pp. 118
-
-
Casnovas, J.1
Ricart, J.M.2
Rubio, J.3
Illas, F.4
Matros, J.M.J.5
|