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Volumn 49, Issue 3, 2003, Pages 237-242
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Segregation of Fe during the sintering of doped W-Cu alloys
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Author keywords
Analytical electron microscopy; Copper; Interface segregation; Refractory metals
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Indexed keywords
COPPER ALLOYS;
DOPING (ADDITIVES);
INTERFACES (MATERIALS);
IRON;
SEGREGATION (METALLOGRAPHY);
SINTERING;
TRANSMISSION ELECTRON MICROSCOPY;
INTERFACIAL SEGREGATION;
TUNGSTEN ALLOYS;
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EID: 0037841842
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(03)00244-6 Document Type: Article |
Times cited : (60)
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References (25)
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