Towards the intelligent CMM

CIRP Annals - Manufacturing Technology

Volumn 51, Issue 1, 2002, Pages 437-442

  Zhang, G X ^a   Liu, S G ^a   Ma, X H ^a   Wang, J L ^a   Wu, Y Q ^a   Li, Z ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Coordinate measuring machine (CMM); Intelligent technique; Measurement

Indexed keywords

AUTOMATION; CAMERAS; FEATURE EXTRACTION; INTELLIGENT MATERIALS; RELIABILITY;

INITIAL GRAPHICS EXCHANGE SPECIFICATION (IGES);

COORDINATE MEASURING MACHINES;

EID: 0037838704     PISSN: 00078506     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0007-8506(07)61555-8     Document Type: Article

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