Controlled polystyrene brushes grown on AFM tip

European Physical Journal E

Volumn 10, Issue 1, 2003, Pages 77-81

  Devaux, C ^a   Chapel, J P ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; FREE RADICAL POLYMERIZATION; GRAFTING (CHEMICAL); OPTICAL MULTILAYERS; SILICON WAFERS; WATER; XYLENE;

LANGMUIR BLODGETT DEPOSITION TECHNIQUE; POLYSTYRENE BRUSHES;

POLYSTYRENES;

EID: 0037832408     PISSN: 12928941     EISSN: None     Source Type: Journal    
DOI: 10.1140/epje/e2003-00010-5     Document Type: Article

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