Nanometer measurement with a dual Fabry–Perot interferometer

Applied Optics

Volumn 40, Issue 31, 2001, Pages 5632-5637

  Chen, Benyong ^a   Zhu, Ruogu ^b,c   Wu, Zhaotong ^c   Li, Dacheng ^a   Guo, Songling ^a  

^a TSINGHUA UNIVERSITY   (China)

^b CHINA JILIANG UNIVERSITY   (China)

^c ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

GRAVITY WAVES; PHASE MODULATION; REFRACTIVE INDEX; SENSORS;

TWYMAN-GREEN INTERFEROMETERS;

FABRY-PEROT INTERFEROMETERS;

EID: 0037822267     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.005632     Document Type: Article

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