Reliability mechanisms for very large storage systems

Digest of Papers - IEEE Symposium on Mass Storage Systems

Volumn , Issue , 2003, Pages 146-156

  Xin, Qin ^a   Miller, Ethan L ^a   Schwarz, Thomas ^b   Long, Darrell D E ^a   Brandt, Scott A ^a   Litwin, Witold ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SANTA CLARA UNIVERSITY   (United States)

^c UNIVERSITÉ PARIS DAUPHINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEM RECOVERY; ERROR ANALYSIS; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; LARGE SCALE SYSTEMS; RELIABILITY;

NONRECOVERABLE DRIVE ERRORS; NONRECOVERABLE READ ERRORS; VERY LARGE STORAGE SYSTEMS;

HARD DISK STORAGE;

EID: 0037819521     PISSN: 10519173     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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