Erratic erase in flash memories - Part I: Basic experimental and statistical characterization

IEEE Transactions on Electron Devices

Volumn 50, Issue 4, 2003, Pages 1009-1014

  Chimenton, Andrea ^a   Olivo, Piero ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

Erasing operation; Flash memories; Integrated circuit reliability; Semiconductor memories

Indexed keywords

CORRELATION METHODS; DATA REDUCTION; FAILURE ANALYSIS; FUNCTIONS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; RELIABILITY; SILICA; STATISTICAL METHODS; THRESHOLD VOLTAGE;

SEMICONDUCTOR MEMORIES;

FLASH MEMORY;

EID: 0037818414     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.812098     Document Type: Article

References (8)

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7. A. Chimenton and P. Olivo, "Erratic erase in Flash memories - Part II: Dependence on operating conditions," IEEE Trans. Electron Devices, vol. 50, pp. 1015-1021, Apr. 2003.
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