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Volumn , Issue , 2003, Pages 630-633

Field-assisted bonding of glass to Si-Au eutectic solder for packaging applications

Author keywords

[No Author keywords available]

Indexed keywords

BOND STRENGTH (MATERIALS); BONDING; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRONICS PACKAGING; EUTECTICS; GLASS; GOLD; SILICON WAFERS;

EID: 0037817758     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (19)

References (8)
  • 2
    • 0035506511 scopus 로고    scopus 로고
    • Wafer-to-wafer bonding of nonplanarized MEMS surfaces using solder
    • Nov.
    • D. Sparks, et. al., "Wafer-to-wafer bonding of nonplanarized MEMS surfaces using solder", J. of Micromechanics and Microengineering, vol. 11, no. 6 Nov. 2001, pp. 630-634.
    • (2001) J. of Micromechanics and Microengineering , vol.11 , Issue.6 , pp. 630-634
    • Sparks, D.1
  • 3
    • 0033896042 scopus 로고    scopus 로고
    • Initiation toughness of silicon/glass anodic bonds
    • Feb.
    • M. Dunn, et. al., "Initiation toughness of silicon/glass anodic bonds", Acta Materialia, vol. 48, no. 3, Feb. 2000, pp. 735-744.
    • (2000) Acta Materialia , vol.48 , Issue.3 , pp. 735-744
    • Dunn, M.1
  • 4
    • 0004070892 scopus 로고    scopus 로고
    • Solders and soldering
    • New York, McGraw-Hill
    • H. H. Manko, Solders and Soldering. The metallurgy of solder, 4th ed. New York, McGraw-Hill. 2001, pp. 73-81.
    • (2001) The Metallurgy of Solder, 4th Ed. , pp. 73-81
    • Manko, H.H.1
  • 5
    • 0031177094 scopus 로고    scopus 로고
    • Low-temperature intermediate Au-Si wafer bonding: Eutectic or silicide bond
    • July
    • R. F. Wolffenbuttel, "Low-temperature intermediate Au-Si wafer bonding: eutectic or silicide bond", Sensors and Actuators, vol. A62, no. 1-3, July 1997, p.680-6.
    • (1997) Sensors and Actuators , vol.A62 , Issue.1-3 , pp. 680-686
    • Wolffenbuttel, R.F.1
  • 6
    • 0034467134 scopus 로고    scopus 로고
    • An improved anodic bonding process using pulsed voltage technique
    • Dec.
    • T. Lee, et. al., "An improved anodic bonding process using pulsed voltage technique", JMEMS, vol.9, no.4, Dec. 2000, p.469-73.
    • (2000) JMEMS , vol.9 , Issue.4 , pp. 469-473
    • Lee, T.1
  • 7
    • 0038355688 scopus 로고
    • In situ stress measurements of gold films on glass substrates during thermal cycling
    • Dec.
    • A. Katz, et. al., "In situ stress measurements of gold films on glass substrates during thermal cycling", J. Appl. Phys., vol. 70, no. 12, Dec. 1991, pp. 7342-7348.
    • (1991) J. Appl. Phys. , vol.70 , Issue.12 , pp. 7342-7348
    • Katz, A.1
  • 8
    • 0004579526 scopus 로고    scopus 로고
    • Hermetic glass-silicon micropackages and feedthroughs for neural prostheses
    • Doctoral thesis, University of Michigan
    • M. R. Dokmeci, "Hermetic glass-silicon micropackages and feedthroughs for neural prostheses", Doctoral thesis, University of Michigan, 2000, pp. 42.
    • (2000) , pp. 42
    • Dokmeci, M.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.