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Volumn 35, Issue 16, 1996, Pages 4727-4732

Structural and Spectroscopic Characterization of Ditungsten Halide Compounds

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0037801267     PISSN: 00201669     EISSN: None     Source Type: Journal    
DOI: 10.1021/ic951617y     Document Type: Article
Times cited : (8)

References (40)
  • 12
    • 2542592074 scopus 로고    scopus 로고
    • Diffractometer data collection controlled by P3-PC version (Siemens Analytical X-Ray Instruments, Inc. Madison, WI)
    • Diffractometer data collection controlled by P3-PC version (Siemens Analytical X-Ray Instruments, Inc. Madison, WI.).
  • 14
    • 0004148376 scopus 로고
    • Oxford University Press: Oxford, U.K.
    • Sheldrick, G. M. Crystallographic Computing; Oxford University Press: Oxford, U.K., 1992; pp 111-122.
    • (1992) Crystallographic Computing , pp. 111-122
    • Sheldrick, G.M.1
  • 15
    • 0004150157 scopus 로고    scopus 로고
    • Siemens Analytical X-Ray Instruments, Inc., Madison, WI
    • SHELXA-90 Version 1, Siemens Analytical X-Ray Instruments, Inc., Madison, WI.
    • SHELXA-90 Version 1
  • 16
    • 0003872738 scopus 로고
    • D. Reidel Publishing: Dordrecht, The Netherlands
    • International Tables for X-Ray Crystallography; D. Reidel Publishing: Dordrecht, The Netherlands, 1985; Vol. IV.
    • (1985) International Tables for X-Ray Crystallography , vol.4
  • 17
    • 2542515821 scopus 로고    scopus 로고
    • XEMP, Siemens Industrial X-Ray, Madison WI
    • XEMP, Siemens Industrial X-Ray, Madison WI.
  • 24
    • 0004200260 scopus 로고
    • Brooks/Cole Publishing Company: Pacific Grove, CA
    • McMurry, J. Organic Chemistry, 2nd ed.; Brooks/Cole Publishing Company: Pacific Grove, CA, 1988; p 721.
    • (1988) Organic Chemistry, 2nd Ed. , pp. 721
    • McMurry, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.